The unique properties of silicon make it particularly suited to be the foundational material for semiconductor production. Wafer ... All of this falls under the general category of semiconductor ...

This advanced tool helps researchers quickly analyze crystal quality, strain, and doping levels in semiconductor samples and wafers. The microscope features an extended-range scanning stage that ...

Metrology tools combined with wafer inspection capabilities are able to ensure that they target physical and electrical properties of semiconductor devices under production. Wafer metrology is able to ...