The JEOL TEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS).

It is often performed in conjunction with transmission electron microscopy (TEM), providing high spatial resolution ... experiment in a scanning transmission electron microscope (STEM). An electron ...

The Electron and Scanning Probe Microscopy Unit provides ... detector has also been installed on our existing Field Emission Gun SEM. In 2015 a new high resolution analytical FEG-TEM will be installed ...